On the basis of the interference fringes in the transparency and reflection spectra of the free film or a film on the substrate when the substrate and the film material does not absorb light, can be determined by one of the optical constants of the material at a blank principal refractive index, if the film thickness is known.
Published in | American Journal of Physics and Applications (Volume 2, Issue 6) |
DOI | 10.11648/j.ajpa.20140206.16 |
Page(s) | 150-155 |
Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
Copyright |
Copyright © The Author(s), 2014. Published by Science Publishing Group |
Structure, Optical Constants, Absorption Coefficientl, Surface
[1] | Moss T.S. // Semiconductor Opto-Electronics, Butterworth-Heinemann (1973) 454. |
[2] | Axmedov G. // The phase composition of the films of Bi-S formation Bi2S3 different substructure, Fizika i texnika poluprovodnikov, (2008) vol. 42. no.2. pp. 129-130. (in Russian) |
[3] | Qalant E. Apparatus for measuring small absorption coefficients inactive in the active elements of the laser glass. Journal of Applied Spectroscopy. 18, (1973) №4, 636 (in Russian) |
[4] | Axmedov G. Kinetic of phase transformations of Bi2Se3 nanotickness films, Scientifik Israel – technological advantages (2011) vol. 13. no.4. pp. 57-62. |
[5] | Ch. Hu, Winnery D.R., New Termooptical Measurement Method and a Comparison with other Methods, Appl. Optics 12, #1, 72 (1973) |
[6] | Donovan T.M., Seraphin B.O., Undemaged Germanium Surfaces of High Optical Quality, J. Electrochem. Soc., (1962) 109, 877 |
[7] | Rozenberq Q. Optical thin film coatings. Fizmatqiz, 1958 (in Russian) |
[8] | Valeev A. Determination of optical constants of thin weakly absorbing layers. Optics and Spectroscopy. 15, (1963) 500 (in Russian) |
[9] | Axmedov G. Physical Properties and Influence of the Tempering on Electric Properties Films Bi2Te3, International Journal of Materials Science and Applications. Vol. 3, No. 3, 2014, pp. 111-115. doi: 10.11648/j.ijmsa.20140303.17 |
[10] | Ismailov D., Axmedov G., Shafizade R. // Reports of Academy of Azerbaijan (1989). vol. XLV. no.4. pp. 4. (in Russian) |
APA Style
Gurban Axmedov. (2014). Methods for Determination of the Optical Constants of the Substance BiTe-BiSe. American Journal of Physics and Applications, 2(6), 150-155. https://doi.org/10.11648/j.ajpa.20140206.16
ACS Style
Gurban Axmedov. Methods for Determination of the Optical Constants of the Substance BiTe-BiSe. Am. J. Phys. Appl. 2014, 2(6), 150-155. doi: 10.11648/j.ajpa.20140206.16
@article{10.11648/j.ajpa.20140206.16, author = {Gurban Axmedov}, title = {Methods for Determination of the Optical Constants of the Substance BiTe-BiSe}, journal = {American Journal of Physics and Applications}, volume = {2}, number = {6}, pages = {150-155}, doi = {10.11648/j.ajpa.20140206.16}, url = {https://doi.org/10.11648/j.ajpa.20140206.16}, eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20140206.16}, abstract = {On the basis of the interference fringes in the transparency and reflection spectra of the free film or a film on the substrate when the substrate and the film material does not absorb light, can be determined by one of the optical constants of the material at a blank principal refractive index, if the film thickness is known.}, year = {2014} }
TY - JOUR T1 - Methods for Determination of the Optical Constants of the Substance BiTe-BiSe AU - Gurban Axmedov Y1 - 2014/12/22 PY - 2014 N1 - https://doi.org/10.11648/j.ajpa.20140206.16 DO - 10.11648/j.ajpa.20140206.16 T2 - American Journal of Physics and Applications JF - American Journal of Physics and Applications JO - American Journal of Physics and Applications SP - 150 EP - 155 PB - Science Publishing Group SN - 2330-4308 UR - https://doi.org/10.11648/j.ajpa.20140206.16 AB - On the basis of the interference fringes in the transparency and reflection spectra of the free film or a film on the substrate when the substrate and the film material does not absorb light, can be determined by one of the optical constants of the material at a blank principal refractive index, if the film thickness is known. VL - 2 IS - 6 ER -